@inproceedings{568ed52cc76843d99f70ffc95f96dbbe,
title = "Quantitative characterization of the interface between a V 2O3 layer and Cu3Au (001) by Cs corrected HREM",
abstract = "Vanadium oxides are materials of interest due to their electronic, magnetic and catalytic properties. In the case of V2O3 and Cu 3Au, the interfacial bonding is rather difficult to describe since the two component materials have strongly different electronic structures. Thus a local investigation of the interface becomes important. In this investigation, the incoherent interface between a V2O3 (0001, corundum structure) layer and a Cu3Au (001, L12 structure) substrate is characterized with the help of image corrected high resolution electron microscopy (HRTEM) and focal series reconstruction in order to investigated both the true position of atoms and the nature of the atomic species. Semi-quantitative results can be shown for the chemical composition of columns and strains at one side of the interface.",
author = "Calderon, {H. A.} and H. Niehus and B. Freitag and D. Wall and F. Stavale and Achete, {C. A.}",
year = "2009",
doi = "10.1557/proc-1184-hh08-10",
language = "Ingl{\'e}s",
isbn = "9781605111575",
series = "Materials Research Society Symposium Proceedings",
publisher = "Materials Research Society",
pages = "203--208",
booktitle = "Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials",
address = "Estados Unidos",
note = "2009 MRS Spring Meeting: Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials ; Conference date: 14-04-2009 Through 16-04-2009",
}