TY - GEN
T1 - Preparation of Y3Al5O12:Eu3+ waveguide films by sol-gel method
AU - Murillo, A. Garcia
AU - Romo, Felipe J.De Carrillo
AU - Castro, N. Cayetano
AU - Orozco, Claudia Torres
AU - Febles, V. Garibay
AU - Hernández, M. García
AU - Meneses, Esther Ramírez
PY - 2009
Y1 - 2009
N2 - Y3Al5O12:Eu3+ (5 mol% Eu 3+) optical thick films were obtained by sol-gel process and dip-coating technique. The synthesis was accomplished using Al(OC 4H9)3, YCl3·6H2O, isopropanol and Eu(NO3)3·5H2O. The chelating agent was (CH3COCH2COCH3, AcacH). After the deposition stage, the YAG:Eu3+ films were dried and annealed for 1 h at 700, 900 and 1100 °C. Multilayers were deposited to obtain multimode waveguides. X-Ray diffraction analysis confirmed that Y 3Al5O12:Eu3+ films presented characteristic YAG structure. Microscopic observations (HRTEM) of the films heat-treated at 1100 °C revealed that the YAG:Eu3+ films were constituted of particles with diameters of about 25 nm. The optogeometrical characteristics as thickness (t) and refractive index (n) were performed using the M-Lines Spectroscopy (MLS) using a He-Ne laser (632.8 nm). These results showed that the thickness and refractive index of the Y3Al 5O12:Eu3+ film after a heat treatment at 1100 °C were 1.3μm 1.6385 ± 0.001 respectively.
AB - Y3Al5O12:Eu3+ (5 mol% Eu 3+) optical thick films were obtained by sol-gel process and dip-coating technique. The synthesis was accomplished using Al(OC 4H9)3, YCl3·6H2O, isopropanol and Eu(NO3)3·5H2O. The chelating agent was (CH3COCH2COCH3, AcacH). After the deposition stage, the YAG:Eu3+ films were dried and annealed for 1 h at 700, 900 and 1100 °C. Multilayers were deposited to obtain multimode waveguides. X-Ray diffraction analysis confirmed that Y 3Al5O12:Eu3+ films presented characteristic YAG structure. Microscopic observations (HRTEM) of the films heat-treated at 1100 °C revealed that the YAG:Eu3+ films were constituted of particles with diameters of about 25 nm. The optogeometrical characteristics as thickness (t) and refractive index (n) were performed using the M-Lines Spectroscopy (MLS) using a He-Ne laser (632.8 nm). These results showed that the thickness and refractive index of the Y3Al 5O12:Eu3+ film after a heat treatment at 1100 °C were 1.3μm 1.6385 ± 0.001 respectively.
KW - Europium
KW - M-lines
KW - Sol-gel
KW - Waveguides
KW - Yttrium aluminium garnet
UR - http://www.scopus.com/inward/record.url?scp=70450203632&partnerID=8YFLogxK
M3 - Contribución a la conferencia
AN - SCOPUS:70450203632
SN - 9781439817827
T3 - Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
SP - 383
EP - 386
BT - Nanotechnology 2009
T2 - Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Y2 - 3 May 2009 through 7 May 2009
ER -