Resumen
In this work different mixed Silicon oxicarbide materials have been prepared. Si, Si-Ti, Si-Zr and Si-Al oxicarbide materials have been obtained from pyrolisis at 1000 °C and 1300 °C of the respective preceramic materials. After pyrolisis X, D and T units of the oxycarbide structure have been observed in such materials. They show the presence of Si-C and Si-O bonds in a given material. The characterization has been carried out by means of FT-IR, Raman NMR 29Si, NMR 13C and XRD. The formation of Si-Ti, Si-Zr and Si-Al bonds has been estimated in accordance with the decrease of the Si-O-Si wave number observed in the FT-IR spectra. Si and Si-Ti oxycarbide materials do not lead to crystallisation after pyrolisis at highest temperatures, however for Si-Zr and Si-Al oxycarbide materials different crystalline phases have been observed. All pyrolised materials present free and carbidic carbon. After pyrolisis at 1300 °C the free carbon reacts with Si-O bonds to form SiC4 groups which must be assigned to nucleus of the β-SiC crystals.
Título traducido de la contribución | Preparation and characterisation of mixed silicon oxycarbide materials |
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Idioma original | Español |
Páginas (desde-hasta) | 105-112 |
Número de páginas | 8 |
Publicación | Boletin de la Sociedad Espanola de Ceramica y Vidrio |
Volumen | 49 |
N.º | 2 |
Estado | Publicada - mar. 2010 |
Publicado de forma externa | Sí |
Palabras clave
- Crystallisation
- Mixed oxycarbide
- Preceramic
- Pyrolisis