Resumen
In this work we successfully prepared p-type semiconducting Cu2-xTe layers on Cu substrates by applying a potential multistep signal. Spontaneously deposited tellurium layers were reduced in a single cathodic sweep. The X-ray diffraction characterization showed the presence of single-phased, crystalline Cu2-xTe in the weissite form. A further anodization step allows crystallization of several phases such as Cu1.75Te, Cu0.664Te0.336 and Cu7Te4. This type of sample was found to be photoactive. The prepared films are p-type and have carrier concentrations in the order of 1021 cm-3, suitable for CdTe-Cu2-xTe contacts.
Idioma original | Inglés |
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Páginas (desde-hasta) | 1684-1687 |
Número de páginas | 4 |
Publicación | Electrochemistry Communications |
Volumen | 10 |
N.º | 11 |
DOI | |
Estado | Publicada - nov. 2008 |
Publicado de forma externa | Sí |