TY - GEN
T1 - Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry
AU - Pascual-Francisco, Juan Benito
AU - Susarrey-Huerta, Orlando
AU - Michtchenko, Alexandre
AU - Barragán-Pérez, Omar
N1 - Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
PY - 2018
Y1 - 2018
N2 - In this work, authors present a new application of electronic speckle pattern shearing interferometry (shearography) to a phenomenon known as creep compliance, which is an important mechanical property of viscoelastic materials. Two different sealing elastomers were tested in a short-term creep experiment, applying a constant tensile stress to a specimen. An experimental in-plane shearography setup was implemented to measure the in-plane creep strains produced in the tested object. In order to show the effectiveness of shearography for the assessment of this viscoelastic mechanical property, results were compared to that obtained with an equipment of Digital Image Correlation (DIC). It was demonstrated that shearography can be potentially and successfully applied to the creep analysis of these kind of materials. Finally, advantages and limitations of this measurement method are discussed.
AB - In this work, authors present a new application of electronic speckle pattern shearing interferometry (shearography) to a phenomenon known as creep compliance, which is an important mechanical property of viscoelastic materials. Two different sealing elastomers were tested in a short-term creep experiment, applying a constant tensile stress to a specimen. An experimental in-plane shearography setup was implemented to measure the in-plane creep strains produced in the tested object. In order to show the effectiveness of shearography for the assessment of this viscoelastic mechanical property, results were compared to that obtained with an equipment of Digital Image Correlation (DIC). It was demonstrated that shearography can be potentially and successfully applied to the creep analysis of these kind of materials. Finally, advantages and limitations of this measurement method are discussed.
KW - Creep strain
KW - Digital image correlation
KW - Polymers
KW - Shearography
UR - http://www.scopus.com/inward/record.url?scp=85051847329&partnerID=8YFLogxK
U2 - 10.1117/12.2303899
DO - 10.1117/12.2303899
M3 - Contribución a la conferencia
AN - SCOPUS:85051847329
SN - 9781510618459
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Dimensional Optical Metrology and Inspection for Practical Applications VII
A2 - Zhang, Song
A2 - Harding, Kevin G.
PB - SPIE
T2 - Dimensional Optical Metrology and Inspection for Practical Applications VII 2018
Y2 - 17 April 2018 through 19 April 2018
ER -