Lumped model-based analysis of hBN RF switches

Omar Jordan-Garcia, Eloy Ramirez-Garcia, David Jimenez, Anibal Pacheco-Sanchez

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

The intrinsic and extrinsic impedance parameters, the return loss, insertion loss and isolation of RF two-dimensional switches fabricated with hexagonal boron nitride (hBN) are described here by a lumped equivalent circuit model. Straight-forward analytical expressions are obtained. In contrast to conventional switches, the unique RF performance of the hBN switch, at ON-state i.e., a direct improvement with frequency of the insertion loss, is accurately described by considering a capacitor in the intrinsic part of the model. The latter is suggested to be related to storaged charge during the resistive switching mechanism.

Idioma originalInglés
Título de la publicación alojada2022 IEEE Latin America Electron Devices Conference, LAEDC 2022
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781665497671
DOI
EstadoPublicada - 2022
Evento2022 IEEE Latin America Electron Devices Conference, LAEDC 2022 - Cancun, México
Duración: 4 jul. 20226 jul. 2022

Serie de la publicación

Nombre2022 IEEE Latin America Electron Devices Conference, LAEDC 2022

Conferencia

Conferencia2022 IEEE Latin America Electron Devices Conference, LAEDC 2022
País/TerritorioMéxico
CiudadCancun
Período4/07/226/07/22

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