TY - CHAP
T1 - Influence of the fluence and substrate temperature on the structural and optical properties of CdSe thin films prepared by pulsed laser deposition
AU - Hernandez-Perez, M. A.
AU - Aguilar-Hernandez, J.
AU - Vargas-Garcia, J. R.
AU - Contreras-Puente, G.
AU - Rangel-Salinas, E.
AU - Hernandez-Santiago, F.
AU - Vargas-Ramírez, M.
PY - 2011
Y1 - 2011
N2 - Cadmium Selenide (CdSe) thin films were prepared by pulsed laser deposition using a Nd:YAG laser (355 nm). Films were grown by ablating a sintered pure CdSe target with fluences from 0.1 to 1.5 J/cm2 on corning glass, silicon (100) and quartz substrates. Deposition chamber was maintained under vacuum pressure while substrate temperature was increased from room temperature to 500° C in order to control the crystalline phase. All the films show mirror-like surface morphology. Atomic force microscopy (AFM) images shown that films have very flat surfaces with RMS values around 0.7 and 5 nm for room temperature and 500° C respectively. The X-ray diffraction analysis proves the presence of the cubic zinc blend phase for the CdSe films deposited at low temperature, at 400° C and at higher substrate temperature the hexagonal phase is present. TEM analysis shows that at 100°C the films are constituted by particles with an average size of 30nm in diameter. The optical properties of the films were determined from the UV-transmission spectra. The estimated band gap values of the films deposited at room temperature and at 400°C (0.1 J/cm2) were 1.87 and 1.70 eV respectively.
AB - Cadmium Selenide (CdSe) thin films were prepared by pulsed laser deposition using a Nd:YAG laser (355 nm). Films were grown by ablating a sintered pure CdSe target with fluences from 0.1 to 1.5 J/cm2 on corning glass, silicon (100) and quartz substrates. Deposition chamber was maintained under vacuum pressure while substrate temperature was increased from room temperature to 500° C in order to control the crystalline phase. All the films show mirror-like surface morphology. Atomic force microscopy (AFM) images shown that films have very flat surfaces with RMS values around 0.7 and 5 nm for room temperature and 500° C respectively. The X-ray diffraction analysis proves the presence of the cubic zinc blend phase for the CdSe films deposited at low temperature, at 400° C and at higher substrate temperature the hexagonal phase is present. TEM analysis shows that at 100°C the films are constituted by particles with an average size of 30nm in diameter. The optical properties of the films were determined from the UV-transmission spectra. The estimated band gap values of the films deposited at room temperature and at 400°C (0.1 J/cm2) were 1.87 and 1.70 eV respectively.
UR - http://www.scopus.com/inward/record.url?scp=79960402371&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/MSF.691.134
DO - 10.4028/www.scientific.net/MSF.691.134
M3 - Capítulo
AN - SCOPUS:79960402371
SN - 9783037851838
T3 - Materials Science Forum
SP - 134
EP - 138
BT - Metastable and Nanostructured Materials IV
PB - Trans Tech Publications Ltd
ER -