Indium incorporation at In_xGa_1-xN relaxed self-assembled nanostructures on Si substrates

Ingeniería y ciencia de los materiales

• Indium 100%
• Nanostructures 94%
• Rutherford backscattering spectroscopy 71%
• Substrates 54%
• Spectrometry 50%
• Reflection high energy electron diffraction 39%
• X ray diffraction 37%
• Photoluminescence 31%
• Molecular beam epitaxy 29%
• Ternary alloys 29%
• Diffraction patterns 27%
• Bending (forming) 26%
• Phase separation 24%
• Atomic force microscopy 24%
• Energy gap 21%
• Atoms 19%
• Nitrogen 17%
• Scanning electron microscopy 15%
• Chemical analysis 12%
• Temperature 7%

Física y astronomía

• indium 73%
• backscattering 34%
• range (extremes) 22%
• assembling 22%
• ternary alloys 21%
• diffraction 20%
• spectroscopy 20%
• high energy electrons 19%
• x rays 17%
• electron diffraction 16%
• molecular beam epitaxy 16%
• diffraction patterns 15%
• atomic force microscopy 14%
• nitrogen 14%
• photoluminescence 13%
• scanning electron microscopy 12%
• shift 11%
• atoms 9%
• energy 5%

Química

• Rutherford Backscattering Spectroscopy 49%
• Nanomaterial 48%
• Reflection High Energy Electron Diffraction 31%
• Molecular Beam Epitaxy 27%
• Photoluminescence Spectrum 19%
• X-Ray Diffraction 19%
• Liquid Film 18%
• Phase Separation 16%
• Atomic Force Microscopy 15%
• Band Gap 14%
• Alloy 13%
• Strain 13%
• Surface 12%
• Scanning Electron Microscopy 11%
• Energy 9%