Improving the structural characterization of supported on glass gold nanoparticles using atomic force microscopy at vacuum

N. Muñoz Aguirre, J. E.Rivera López, L. Martínez Pérez, P. Tamayo Meza

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

Surface characteristics of gold nanoparticles [1] at ambient conditions and in vacuum of the order of 10-4 Pa are compared using Atomic Force Microscopy topographic images in tapping mode. The results show the improvements of the images got at lower pressure than that obtained to normal laboratory conditions. The image got at lower pressure shows more clearly the like spheroid shape characteristics of the particles as predicted by the SPR experiments and theory [1]. Profiles and RMS roughness of the particles are also measured.

Idioma originalInglés
Título de la publicación alojadaNanotechnology 2009
Subtítulo de la publicación alojadaFabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Páginas368-370
Número de páginas3
EstadoPublicada - 2009
EventoNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009 - Houston, TX, Estados Unidos
Duración: 3 may. 20097 may. 2009

Serie de la publicación

NombreNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Volumen1

Conferencia

ConferenciaNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
País/TerritorioEstados Unidos
CiudadHouston, TX
Período3/05/097/05/09

Huella

Profundice en los temas de investigación de 'Improving the structural characterization of supported on glass gold nanoparticles using atomic force microscopy at vacuum'. En conjunto forman una huella única.

Citar esto