TY - JOUR
T1 - Fractal analysis of powder X-ray diffraction patterns
AU - Ortiz-Cruz, A.
AU - Santolalla, C.
AU - Moreno, E.
AU - De Los Reyes-Heredia, J. A.
AU - Alvarez-Ramirez, J.
PY - 2012/2/15
Y1 - 2012/2/15
N2 - X-ray diffraction (XRD) patterns with broad background are commonly found in the characterization of materials with a certain degree of amorphicity, so the sharp intensity peaks associated with material phases are not well defined. This work used rescaled range (denoted by R/S) analysis, a method intended for fractal analysis of noisy signals, to characterize XRD patterns with broad background. It is found that XRD patterns with broad background are not random at all, but contain information on regularities expressed as autocorrelations of the intensity signal. Solgel alumina fired at different temperatures was used as an example to illustrate the applicability of the method. It is shown that fractal R/S analysis is able to locate angular regions that can be associated to ideal International Centre for Diffraction Data Powder Diffraction File (ICDD PDF) lines of diverse alumina phases.
AB - X-ray diffraction (XRD) patterns with broad background are commonly found in the characterization of materials with a certain degree of amorphicity, so the sharp intensity peaks associated with material phases are not well defined. This work used rescaled range (denoted by R/S) analysis, a method intended for fractal analysis of noisy signals, to characterize XRD patterns with broad background. It is found that XRD patterns with broad background are not random at all, but contain information on regularities expressed as autocorrelations of the intensity signal. Solgel alumina fired at different temperatures was used as an example to illustrate the applicability of the method. It is shown that fractal R/S analysis is able to locate angular regions that can be associated to ideal International Centre for Diffraction Data Powder Diffraction File (ICDD PDF) lines of diverse alumina phases.
KW - Alumina
KW - Fractional noise
KW - Hurst exponent
KW - X-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=84655167945&partnerID=8YFLogxK
U2 - 10.1016/j.physa.2011.10.008
DO - 10.1016/j.physa.2011.10.008
M3 - Artículo
SN - 0378-4371
VL - 391
SP - 1642
EP - 1651
JO - Physica A: Statistical Mechanics and its Applications
JF - Physica A: Statistical Mechanics and its Applications
IS - 4
ER -