Resumen
The relationship between the excess currents and strucure defects in In//xGa//1// minus //xAs:Si/GaAs (x equals 0. 035) light-emitting p-n homojunctions was determined by recording the current-voltage and capacitance-voltage characteristics and by metallographic investigations of diodes with different numbers of defects after irradiation with subthreshold (E equals 250 kev) electrons. A strong structural nonequilibrium of the heterojunction system was demonstrated and a correlation was established between the dislocation densities at the heterojunction and in the space-charge region of the p-n junction, on the one hand, and the excess current, on the other.
Idioma original | Inglés |
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Páginas (desde-hasta) | 875-878 |
Número de páginas | 4 |
Publicación | Soviet physics. Semiconductors |
Volumen | 18 |
N.º | 8 |
Estado | Publicada - ago. 1984 |
Publicado de forma externa | Sí |