EXCESS CURRENTS AND STRUCTURE DEFECTS IN In//xGa//1// minus //xAs:Si LIGHT-EMITTING DIODES.

T. V. Torchinskaya, E. Yu Brailovskii, G. N. Semenova, L. A. Matveeva, M. A. Mirzazhanov, T. G. Berdinskikh, I. B. Puzin, N. Arias

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Resumen

The relationship between the excess currents and strucure defects in In//xGa//1// minus //xAs:Si/GaAs (x equals 0. 035) light-emitting p-n homojunctions was determined by recording the current-voltage and capacitance-voltage characteristics and by metallographic investigations of diodes with different numbers of defects after irradiation with subthreshold (E equals 250 kev) electrons. A strong structural nonequilibrium of the heterojunction system was demonstrated and a correlation was established between the dislocation densities at the heterojunction and in the space-charge region of the p-n junction, on the one hand, and the excess current, on the other.

Idioma originalInglés
Páginas (desde-hasta)875-878
Número de páginas4
PublicaciónSoviet physics. Semiconductors
Volumen18
N.º8
EstadoPublicada - ago. 1984
Publicado de forma externa

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