TY - JOUR
T1 - Electrical and optical characterization of Na
T2 - IMRC 2004
AU - Peza-Tapia, J. M.
AU - Sánchez-Reséndiz, V. M.
AU - Albor-Aguilera, M. L.
AU - Cayente-Romero, J. J.
AU - De León-Gutiérrez, L. R.
AU - Ortega-López, M.
PY - 2005/11/1
Y1 - 2005/11/1
N2 - The structural, electrical and optical properties of Na-doped CuInS 2 thin films grown by spray pyrolysis were studied. These films crystallized in the sphalerite structure of CuInS2, and showed to contain traces of indium sulfide and CuIn5S8 as impurity phases. All films were In-rich and showed p-type conductivity. The film conductivity was strongly affected by Na-doping, which decreased from 10 -2 to 10-5 S/cm by increasing the [Na]/[Cu] ratio from 0.005 to 0.03 in the spray solution. The band gap energy was observed to increase, from 1.4 to 1.45 eV, with increasing the [Na]/[Cu] ratio. Our results suggested that Na could be an effective acceptor impurity in sprayed CuInS 2.
AB - The structural, electrical and optical properties of Na-doped CuInS 2 thin films grown by spray pyrolysis were studied. These films crystallized in the sphalerite structure of CuInS2, and showed to contain traces of indium sulfide and CuIn5S8 as impurity phases. All films were In-rich and showed p-type conductivity. The film conductivity was strongly affected by Na-doping, which decreased from 10 -2 to 10-5 S/cm by increasing the [Na]/[Cu] ratio from 0.005 to 0.03 in the spray solution. The band gap energy was observed to increase, from 1.4 to 1.45 eV, with increasing the [Na]/[Cu] ratio. Our results suggested that Na could be an effective acceptor impurity in sprayed CuInS 2.
KW - Electrical and optical properties
KW - Na doped CuInS
KW - Thin films
UR - http://www.scopus.com/inward/record.url?scp=24044468407&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2005.04.044
DO - 10.1016/j.tsf.2005.04.044
M3 - Artículo de la conferencia
AN - SCOPUS:24044468407
SN - 0040-6090
VL - 490
SP - 142
EP - 145
JO - Thin Solid Films
JF - Thin Solid Films
IS - 2
Y2 - 22 August 2004 through 26 August 2004
ER -