Resumen
A goodness compactness measure is necessary in computer medical diagnosis, shape analysis and computer vision processes. A compactness measure called the normalised E-factor (NEF) is introduced. It is shown that this measure is simple and robust to translations, rotations and scale changes and that it satisfies the set of criteria for a good compactness measure. Through a series of experiments it is shown that the normalised E-factor is useful for shape description, measuring digital compactness with or without holes and that it overcomes some drawbacks that are present in the classical and normalised discrete compactness measures.
Idioma original | Inglés |
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Páginas (desde-hasta) | 171-173 |
Número de páginas | 3 |
Publicación | Electronics Letters |
Volumen | 50 |
N.º | 3 |
DOI | |
Estado | Publicada - 30 ene. 2014 |