TY - JOUR
T1 - Depth profiling study of the CdTe/CdS/ITO/glass heterostructure with AES and GIXRD
AU - Martel, A.
AU - Caballero-Briones, F.
AU - Oliva, A. I.
AU - Castro-Rodríguez, R.
AU - Iribarren, A.
AU - Bartolo-Pérez, P.
AU - Peña, J. L.
PY - 2000/7
Y1 - 2000/7
N2 - In this work we use Auger electron spectroscopy depth profiling and grazing incidence X-ray diffraction (GIXRD) to study chemical composition and structure of the CdTe/CdS/ITO/glass heterostructure. The CdS layer was deposited on ITO (In2Sn2O7-x) substrates by chemical bath deposition and the CdTe film was deposited by double-step close space sublimation. We found by AES profiling a strong intermixing at the CdS/ITO and CdS/CdTe interfaces, confirmed by GIXRD and evidences of two diffusion steps for the CdS into the ITO matrix. Additionally, the CdS/ITO structure was separately investigated in order to know the influence of the substrate roughness on the heterostructure conformation. The morphology of the ITO substrate and the as-deposited CdS layer was studied by atomic force microscopy. The use of GIXRD showed to be useful to study the entire CdTe/CdS/ITO/glass heterostructure. The ITO roughness has proved to be an influencing factor in the structural features and suggested that CdS roughness can also influence the observed composition profiles.
AB - In this work we use Auger electron spectroscopy depth profiling and grazing incidence X-ray diffraction (GIXRD) to study chemical composition and structure of the CdTe/CdS/ITO/glass heterostructure. The CdS layer was deposited on ITO (In2Sn2O7-x) substrates by chemical bath deposition and the CdTe film was deposited by double-step close space sublimation. We found by AES profiling a strong intermixing at the CdS/ITO and CdS/CdTe interfaces, confirmed by GIXRD and evidences of two diffusion steps for the CdS into the ITO matrix. Additionally, the CdS/ITO structure was separately investigated in order to know the influence of the substrate roughness on the heterostructure conformation. The morphology of the ITO substrate and the as-deposited CdS layer was studied by atomic force microscopy. The use of GIXRD showed to be useful to study the entire CdTe/CdS/ITO/glass heterostructure. The ITO roughness has proved to be an influencing factor in the structural features and suggested that CdS roughness can also influence the observed composition profiles.
UR - http://www.scopus.com/inward/record.url?scp=0034341731&partnerID=8YFLogxK
U2 - 10.1002/1521-3951(200007)220:1<261::AID-PSSB261>3.0.CO;2-4
DO - 10.1002/1521-3951(200007)220:1<261::AID-PSSB261>3.0.CO;2-4
M3 - Artículo
SN - 0370-1972
VL - 220
SP - 261
EP - 267
JO - physica status solidi (b)
JF - physica status solidi (b)
IS - 1
ER -