Dark current compensation in CMOS image sensors using a differential pixel architecture

Philippe M. Beaudoin, Yves Audet, Victor Hugo Ponce-Ponce

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

6 Citas (Scopus)

Resumen

This paper presents a new CMOS active pixel sensor (APS) architecture aimed at compensating the effects of dark current. The suggested circuit consists of an innovative multi-branch differential amplifier configured as a multi-input negative feedback integrator. In addition to its inherent dark current compensation mechanism, the proposed circuit offers a wide dynamic range and an excellent linearity.

Idioma originalInglés
Título de la publicación alojada2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09
DOI
EstadoPublicada - 2009
Evento2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09 - Toulouse, Francia
Duración: 28 jun. 20091 jul. 2009

Serie de la publicación

Nombre2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09

Conferencia

Conferencia2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09
País/TerritorioFrancia
CiudadToulouse
Período28/06/091/07/09

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