Comparison between diffraction intensity for different planar geometries

Mario M. Lehman; I. Carlos; Carlos I. Aguirre Vélez

doi:10.1117/12.451296

Comparison between diffraction intensity for different planar geometries

Mario M. Lehman, I. Carlos, Carlos I. Aguirre Vélez

Producción científica: Contribución a una revista › Artículo de la conferencia › revisión exhaustiva

Resumen

We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propation in the Fresnel and Fraunhofer regions.

Idioma original	Inglés
Páginas (desde-hasta)	159-170
Número de páginas	12
Publicación	Proceedings of SPIE - The International Society for Optical Engineering
Volumen	4436
DOI	https://doi.org/10.1117/12.451296
Estado	Publicada - 2001
Publicado de forma externa	Sí
Evento	Wave-Optical Systems Engineering - San Diego, CA, Estados Unidos Duración: 30 jul. 2001 → 31 jul. 2001

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@article{c47ce566aa2a434193f9197ce0e9d477,

title = "Comparison between diffraction intensity for different planar geometries",

abstract = "We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propation in the Fresnel and Fraunhofer regions.",

keywords = "Cantor bars, Correlation, Diffraction, Fresnel and Fraunhofer regions, Periodic distribution, Self-similarity",

author = "Lehman, {Mario M.} and I. Carlos and {Aguirre V{\'e}lez}, {Carlos I.}",

year = "2001",

doi = "10.1117/12.451296",

language = "Ingl{\'e}s",

volume = "4436",

pages = "159--170",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "Wave-Optical Systems Engineering ; Conference date: 30-07-2001 Through 31-07-2001",

}

TY - JOUR

T1 - Comparison between diffraction intensity for different planar geometries

AU - Lehman, Mario M.

AU - Carlos, I.

AU - Aguirre Vélez, Carlos I.

PY - 2001

Y1 - 2001

N2 - We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propation in the Fresnel and Fraunhofer regions.

AB - We study the properties of the self-similarity function for the intensity distribution of field when different types of gratings, fractal, periodic and aleatory, are used. For this we introduce some definitions considering different points of view that allows us the construction of the diffraction gratings with each geometry. Such structures are applied for the calculation of the electromagnetic field propation in the Fresnel and Fraunhofer regions.

KW - Cantor bars

KW - Correlation

KW - Diffraction

KW - Fresnel and Fraunhofer regions

KW - Periodic distribution

KW - Self-similarity

UR - http://www.scopus.com/inward/record.url?scp=0035759448&partnerID=8YFLogxK

U2 - 10.1117/12.451296

DO - 10.1117/12.451296

M3 - Artículo de la conferencia

AN - SCOPUS:0035759448

SN - 0277-786X

VL - 4436

SP - 159

EP - 170

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Wave-Optical Systems Engineering

Y2 - 30 July 2001 through 31 July 2001

ER -

Comparison between diffraction intensity for different planar geometries

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