TY - JOUR
T1 - Comparative investigations of surface structure, photoluminescence and its excitation in silicon wires
AU - Polupan, G. P.
AU - Torchynska, T. V.
AU - Palacios Gomez, J.
AU - Flores Gonzalez, H. A.
AU - Bacarril Espinoza, F. G.
AU - Ita Torre, A.
AU - Bulakh, B. M.
AU - Scherbina, L. V.
N1 - Funding Information:
This work was partially supported by CONACYT and CGPI-IPN, Mexico, as well as the Ministry of Science and Technology of Ukraine.
PY - 2001/3
Y1 - 2001/3
N2 - The dependence of the photoluminescence (PL) and PL excitation spectra on the porous silicon top surface structure and the oxide composition on it has been investigated. Researches were carried out using the following methods: PL, PL excitation, electron paramagnetic resonance, atomic force microscope and X-ray photoelectron emission spectroscopy. Results indicate a direct correlation between the suboxide content and roughness structure on the surface with PL intensity. No correlation was noted between the PL intensity and the concentration of Si dangling bonds (non-radiative recombination centers). These results have given further support to a suboxide-related color center on the Si/SiOx interface as the source of the intense red luminescence of silicon wires.
AB - The dependence of the photoluminescence (PL) and PL excitation spectra on the porous silicon top surface structure and the oxide composition on it has been investigated. Researches were carried out using the following methods: PL, PL excitation, electron paramagnetic resonance, atomic force microscope and X-ray photoelectron emission spectroscopy. Results indicate a direct correlation between the suboxide content and roughness structure on the surface with PL intensity. No correlation was noted between the PL intensity and the concentration of Si dangling bonds (non-radiative recombination centers). These results have given further support to a suboxide-related color center on the Si/SiOx interface as the source of the intense red luminescence of silicon wires.
UR - http://www.scopus.com/inward/record.url?scp=4244076410&partnerID=8YFLogxK
U2 - 10.1016/S0368-2048(00)00379-0
DO - 10.1016/S0368-2048(00)00379-0
M3 - Artículo de la conferencia
SN - 0368-2048
VL - 114-116
SP - 235
EP - 241
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
T2 - 8th International Conference on Electronic Spectroscopy and Structure (ICESS-8)
Y2 - 8 August 2000 through 12 August 2000
ER -