TY - GEN
T1 - Classification of artificial near-side cracks in aluminium plates using a GMR-based eddy current probe
AU - Arismendi, Nestor Orlando Romero
AU - Pacheco, Eduardo Ramirez
AU - Lopez, Oswaldo Panzo
AU - Espina-Hernandez, J. H.
AU - Benitez, Jose Alberto Perez
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/3/27
Y1 - 2018/3/27
N2 - In the present work a method for the nondestructive classification of crack s width, depth and orientation by using an asymmetrical eddy current GMR-Coil Configuration is proposed. The experimental measurements where performed along five directions in a series of artificial flat cracks with different widths and depths in aluminum. DV and DX values for each of the defects are obtained. The results show that there is a single pair DV, DX for each studied cracks width, depth and orientation. The results also reveal that it is possible to make a classification and estimation of the cracks width, depth and orientation using supervised learning models.
AB - In the present work a method for the nondestructive classification of crack s width, depth and orientation by using an asymmetrical eddy current GMR-Coil Configuration is proposed. The experimental measurements where performed along five directions in a series of artificial flat cracks with different widths and depths in aluminum. DV and DX values for each of the defects are obtained. The results show that there is a single pair DV, DX for each studied cracks width, depth and orientation. The results also reveal that it is possible to make a classification and estimation of the cracks width, depth and orientation using supervised learning models.
KW - GMR sensor
KW - eddy currents
KW - machine learning
KW - nondestructive testing
UR - http://www.scopus.com/inward/record.url?scp=85047311145&partnerID=8YFLogxK
U2 - 10.1109/CONIELECOMP.2018.8327172
DO - 10.1109/CONIELECOMP.2018.8327172
M3 - Contribución a la conferencia
AN - SCOPUS:85047311145
T3 - 2018 28th International Conference on Electronics, Communications and Computers, CONIELECOMP 2018
SP - 31
EP - 36
BT - 2018 28th International Conference on Electronics, Communications and Computers, CONIELECOMP 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 28th International Conference on Electronics, Communications and Computers, CONIELECOMP 2018
Y2 - 21 February 2018 through 23 February 2018
ER -