TY - JOUR
T1 - Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy
AU - Morales-Cruz, Damasio
AU - Paraguay-Delgado, Francisco
AU - Borja-Urby, Raúl
AU - Basurto-Cereceda, Sofía
AU - Herrera-Pérez, Guillermo
AU - Longo, Paolo
AU - Malac, Marek
N1 - Publisher Copyright:
© 2017 Elsevier Ltd
PY - 2017/6/1
Y1 - 2017/6/1
N2 - This work shows the comparison of high-resolution electron energy loss spectra (HR-EELS) in the low loss region (0−15 eV) to investigate the electronic structure from koechilinite Bi2MoO6 to rusellite Bi2WO6 varying the stoichiometric relation Bi2MoxW1−xO6. The effect of the Mo to W ratio on the bandgap energy was evaluated on individual particles. Two approximations were considered in order to determine the band gap energy value, the first one was a linear fit and the second one was a mathematical fit. Both analyses are in agreement with those ones collected and analyzed by UV–Vis characterization. Our results suggest a direct electronic transition that increases from about 2.53 eV to about 3 eV as the W content increase from 0% to 100% wt. X-ray diffraction was used to corroborate the crystal structure and crystal size; transmission electron microscopy was used to monitor the morphology evolution and UV–Vis spectroscopy in diffuse reflectance mode to determine the Eg. These techniques complement the characterization of these materials.
AB - This work shows the comparison of high-resolution electron energy loss spectra (HR-EELS) in the low loss region (0−15 eV) to investigate the electronic structure from koechilinite Bi2MoO6 to rusellite Bi2WO6 varying the stoichiometric relation Bi2MoxW1−xO6. The effect of the Mo to W ratio on the bandgap energy was evaluated on individual particles. Two approximations were considered in order to determine the band gap energy value, the first one was a linear fit and the second one was a mathematical fit. Both analyses are in agreement with those ones collected and analyzed by UV–Vis characterization. Our results suggest a direct electronic transition that increases from about 2.53 eV to about 3 eV as the W content increase from 0% to 100% wt. X-ray diffraction was used to corroborate the crystal structure and crystal size; transmission electron microscopy was used to monitor the morphology evolution and UV–Vis spectroscopy in diffuse reflectance mode to determine the Eg. These techniques complement the characterization of these materials.
KW - Band gap
KW - BiMoWO
KW - Electron energy loss spectroscopy (EELS)
KW - Energy loss function
KW - Transmission electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85013304733&partnerID=8YFLogxK
U2 - 10.1016/j.mssp.2017.02.016
DO - 10.1016/j.mssp.2017.02.016
M3 - Artículo
SN - 1369-8001
VL - 63
SP - 184
EP - 189
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
ER -