Band-gap engineering of halogenated silicon nanowires through molecular doping

Francisco de Santiago, Alejandro Trejo, Alvaro Miranda, Eliel Carvajal, Luis Antonio Pérez, Miguel Cruz-Irisson

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

9 Citas (Scopus)

Resumen

In this work, we address the effects of molecular doping on the electronic properties of fluorinated and chlorinated silicon nanowires (SiNWs), in comparison with those corresponding to hydrogen-passivated SiNWs. Adsorption of n-type dopant molecules on hydrogenated and halogenated SiNWs and their chemisorption energies, formation energies, and electronic band gap are studied by using density functional theory calculations. The results show that there are considerable charge transfers and strong covalent interactions between the dopant molecules and the SiNWs. Moreover, the results show that the energy band gap of SiNWs changes due to chemical surface doping and it can be further tuned by surface passivation. We conclude that a molecular based ex-situ doping, where molecules are adsorbed on the surface of the SiNW, can be an alternative path to conventional doping. [Figure not available: see fulltext.].

Idioma originalInglés
Número de artículo314
PublicaciónJournal of Molecular Modeling
Volumen23
N.º11
DOI
EstadoPublicada - 1 nov. 2017

Huella

Profundice en los temas de investigación de 'Band-gap engineering of halogenated silicon nanowires through molecular doping'. En conjunto forman una huella única.

Citar esto