TY - JOUR
T1 - An Automatic Functional Coverage for Digital Systems Through a Binary Particle Swarm Optimization Algorithm with a Reinitialization Mechanism
AU - Martínez-Cruz, Alfonso
AU - Barrón-Fernández, Ricardo
AU - Molina-Lozano, Herón
AU - Ramírez-Salinas, Marco Antonio
AU - Villa-Vargas, Luis Alfonso
AU - Cortés-Antonio, Prometeo
AU - Cheng, Kwang Ting Tim
N1 - Publisher Copyright:
© 2017, Springer Science+Business Media New York.
PY - 2017/8/1
Y1 - 2017/8/1
N2 - At present, functional verification represents the most expensive part of the digital systems design. Moreover, different problems such as: clock synchronization, code compatibility, simulation automation, new design methodologies, proper use of coverage metrics, among others represent challenges in this area. The automated test vector generation is involved in these problems. In this work, an automated functional test sequences generation for digital systems based on the use of coverage models and a binary Particle Swarm Optimization algorithm with a reinitialization mechanism (BPSOr) is described. Also, a comparison with other meta-heuristic algorithms such as: Genetic algorithms (GA) and pseudo-random generation is presented using different fitness functions, coverage models and devices under verification. The main strategy is based on the combination of the simulation and meta-heuristic algorithms to test the device behavior through the generation of test vector sequences. According to the results, the proposed test generation method represents a good alternative to increase the functional coverage during the automated functional verification of block-level digital systems verification.
AB - At present, functional verification represents the most expensive part of the digital systems design. Moreover, different problems such as: clock synchronization, code compatibility, simulation automation, new design methodologies, proper use of coverage metrics, among others represent challenges in this area. The automated test vector generation is involved in these problems. In this work, an automated functional test sequences generation for digital systems based on the use of coverage models and a binary Particle Swarm Optimization algorithm with a reinitialization mechanism (BPSOr) is described. Also, a comparison with other meta-heuristic algorithms such as: Genetic algorithms (GA) and pseudo-random generation is presented using different fitness functions, coverage models and devices under verification. The main strategy is based on the combination of the simulation and meta-heuristic algorithms to test the device behavior through the generation of test vector sequences. According to the results, the proposed test generation method represents a good alternative to increase the functional coverage during the automated functional verification of block-level digital systems verification.
KW - Coverage models
KW - Coverage points
KW - Digital systems
KW - Functional verification
KW - Genetic algorithm
KW - Meta-heuristic algorithms
KW - Particle swarm optimization algorithm
UR - http://www.scopus.com/inward/record.url?scp=85020128533&partnerID=8YFLogxK
U2 - 10.1007/s10836-017-5665-x
DO - 10.1007/s10836-017-5665-x
M3 - Artículo
SN - 0923-8174
VL - 33
SP - 431
EP - 447
JO - Journal of Electronic Testing: Theory and Applications (JETTA)
JF - Journal of Electronic Testing: Theory and Applications (JETTA)
IS - 4
ER -