Abstract
It has been shown that the intensive and broad "red" photoluminescence band in porous silicon is a nonelementary one and could be decomposed on at least three elementary bands. Photoluminescence, ultrasoft x-ray emission spectroscopy, infrared absorption and atomic force microscopy methods were used to study the reasons for both luminescence band appearance in porous silicon photoluminescence spectra, prepared in different technological conditions. The mechanisms of radiative transition for both elementary bands have been discussed as well.
Translated title of the contribution | Usxes y fenómenos ópticos en estructuras de baja dimensión de Si dependientes de la morfología y composición de óxido de silicio en la superficie de Si |
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Original language | English |
Pages (from-to) | 1047-1052 |
Number of pages | 6 |
Journal | Surface Review and Letters |
Volume | 9 |
Issue number | 2 |
DOIs | |
State | Published - Apr 2002 |