TY - JOUR
T1 - Thermal and optical characterization of ZnxCd1-xS embedded in a zeolite host
AU - Hernández-Guevara, A.
AU - Cruz-Orea, A.
AU - Vigil, O.
AU - Villavicencio, H.
AU - Sánchez-Sinencio, F.
N1 - Funding Information:
This work was partially supported by CONACyT-México. The authors are grateful to Engr. Esther Ayala Maycotte, Engr. Marcela Guerrero and EDS staff laboratory of Physics Department at CINVESTAV-IPN.
PY - 2000/7
Y1 - 2000/7
N2 - Ternary compounds ZnxCd1-xS (0 ≤ X ≤ 1) embedded in mordenite zeolite host are studied by using Photoacoustic techniques and X-ray diffraction. We found the thermal diffusivity, thermal effusivity and band-gap as a function of the X parameter. This study shows a strong dependence of thermal and optical parameters with the X value (Zn% concentration). At low X values, we found a peak in the thermal parameters. From Photoacoustic Spectroscopy (PAS), we observed a parabolic behavior of the band gap as a function of X. The X ray diffraction patterns shows that sintered mordenite host structure was maintained with the growth of the ternary compound, however the intensity of the peaks were sensitive to the X value of these compounds. Electron Diffraction Scattering (EDS) measurements were used to determine the X value of our samples.
AB - Ternary compounds ZnxCd1-xS (0 ≤ X ≤ 1) embedded in mordenite zeolite host are studied by using Photoacoustic techniques and X-ray diffraction. We found the thermal diffusivity, thermal effusivity and band-gap as a function of the X parameter. This study shows a strong dependence of thermal and optical parameters with the X value (Zn% concentration). At low X values, we found a peak in the thermal parameters. From Photoacoustic Spectroscopy (PAS), we observed a parabolic behavior of the band gap as a function of X. The X ray diffraction patterns shows that sintered mordenite host structure was maintained with the growth of the ternary compound, however the intensity of the peaks were sensitive to the X value of these compounds. Electron Diffraction Scattering (EDS) measurements were used to determine the X value of our samples.
UR - http://www.scopus.com/inward/record.url?scp=0141937465&partnerID=8YFLogxK
U2 - 10.1016/S0167-577X(00)00054-9
DO - 10.1016/S0167-577X(00)00054-9
M3 - Artículo
SN - 0167-577X
VL - 44
SP - 330
EP - 335
JO - Materials Letters
JF - Materials Letters
IS - 6
ER -