System for the electrical characterization of solar cells based on one data acquisition board and C#

Jorge Fonseca-Campos, Leonardo Fonseca Ruiz, Juan L. Mata-Machuca

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Renewable energy has grown extensively in the last decades. The photovoltaic panels have been playing a significant role in the technologies used to produce this type of energy. This tendency is expected to continue in the future, because the cost of the solar panels has been gradually reduced. Systems providing information of the electric performance of the solar cells can be helpful for technicians and researchers. In this paper an inexpensive system that measures the I-V curves of photovoltaic cells is presented. With the experimental data the parameters of the single diode model of the solar cell were estimated implementing the simulated annealing algorithm. Three different solar modules were tested at various irradiation levels. A good agreement between the experimental data and the fitted curve was obtained.

Original languageEnglish
Title of host publication2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
ISBN (Electronic)9781538608197
DOIs
StatePublished - 1 Jul 2017
Event2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017 - Ixtapa, Guerrero, Mexico
Duration: 8 Nov 201710 Nov 2017

Publication series

Name2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017
Volume2018-January

Conference

Conference2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017
Country/TerritoryMexico
CityIxtapa, Guerrero
Period8/11/1710/11/17

Keywords

  • C#
  • DAQ
  • I-V Curve
  • simulated annealing and parameters of the solar cell
  • single diode model
  • solar cells

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