TY - GEN
T1 - Synthesis of transparent ZrO 2 thin films by MOCVD
AU - León, P. Cárcamo
AU - Torres-Huerta, A. M.
AU - Domínguez-Crespo, M. A.
AU - Ramírez-Meneses, E.
PY - 2009
Y1 - 2009
N2 - ZrO 2 films on glass and quartz substrates were synthesized by metalorganic chemical vapour deposition (MOCVD) using zirconium acetylacetonate (Zr(acac) 4) as precursor. The reactive and carrier gases were oxygen and argon, respectively. Structural and morphological characterizations were studied by XRD, SEM and AFM. Naked-eye transparent films of cubic ZrO 2 phase were obtained, with crystallite size ranging from 10 - 17 nm. Apparently, the films grow in a columnar structure and there is not contamination by carbon atoms. The film mean roughness is low, ranging from 0.674 to 1.33 nm. The films are forming of particles which sizes are ranging from 0.2 to 1.0 μm for the films grown at 700 °C and from 0.1 to 0.5 μm for the films grown at 500 °C.
AB - ZrO 2 films on glass and quartz substrates were synthesized by metalorganic chemical vapour deposition (MOCVD) using zirconium acetylacetonate (Zr(acac) 4) as precursor. The reactive and carrier gases were oxygen and argon, respectively. Structural and morphological characterizations were studied by XRD, SEM and AFM. Naked-eye transparent films of cubic ZrO 2 phase were obtained, with crystallite size ranging from 10 - 17 nm. Apparently, the films grow in a columnar structure and there is not contamination by carbon atoms. The film mean roughness is low, ranging from 0.674 to 1.33 nm. The films are forming of particles which sizes are ranging from 0.2 to 1.0 μm for the films grown at 700 °C and from 0.1 to 0.5 μm for the films grown at 500 °C.
UR - http://www.scopus.com/inward/record.url?scp=76549118870&partnerID=8YFLogxK
U2 - 10.1149/1.3207628
DO - 10.1149/1.3207628
M3 - Contribución a la conferencia
AN - SCOPUS:76549118870
SN - 9781566777452
T3 - ECS Transactions
SP - 475
EP - 482
BT - ECS Transactions - EuroCVD 17/CVD 17
T2 - 17th International Chemical Vapor Deposition Symposium (CVD-XVII) - 216th Meeting of the Electrochemical Society
Y2 - 4 October 2009 through 9 October 2009
ER -