Structural and surface studies of tin oxide films doped with fluorine

D. R. Acosta; W. Estrada; R. Castanedo; A. Maldonado; M. A. Valenzuela

doi:10.1016/S0040-6090(00)01262-1

Structural and surface studies of tin oxide films doped with fluorine

D. R. Acosta, W. Estrada, R. Castanedo, A. Maldonado, M. A. Valenzuela

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Thin films of SnO₂:F deposited by spray pyrolysis over glass substrate at 300 °C are investigated using scanning, conventional and high resolution electron microscopy together with atomic force microscopy. The surface topology and morphology changes detected for films deposited with various fluorine levels are related to the electrical behavior.

Original language	English
Pages (from-to)	147-150
Number of pages	4
Journal	Thin Solid Films
Volume	375
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(00)01262-1
State	Published - 31 Oct 2000
Externally published	Yes

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10.1016/S0040-6090(00)01262-1

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title = "Structural and surface studies of tin oxide films doped with fluorine",

abstract = "Thin films of SnO2:F deposited by spray pyrolysis over glass substrate at 300 °C are investigated using scanning, conventional and high resolution electron microscopy together with atomic force microscopy. The surface topology and morphology changes detected for films deposited with various fluorine levels are related to the electrical behavior.",

author = "Acosta, {D. R.} and W. Estrada and R. Castanedo and A. Maldonado and Valenzuela, {M. A.}",

note = "Funding Information: We thank the financial support from projects: CONACYT 25254-A and DGAPA IN 101998 in several parts of this work. Also the technical assistance of Mr L. Rend{\'o}n in the HREM laboratory is appreciated.",

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doi = "10.1016/S0040-6090(00)01262-1",

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T1 - Structural and surface studies of tin oxide films doped with fluorine

AU - Acosta, D. R.

AU - Estrada, W.

AU - Castanedo, R.

AU - Maldonado, A.

AU - Valenzuela, M. A.

N1 - Funding Information: We thank the financial support from projects: CONACYT 25254-A and DGAPA IN 101998 in several parts of this work. Also the technical assistance of Mr L. Rendón in the HREM laboratory is appreciated.

PY - 2000/10/31

Y1 - 2000/10/31

N2 - Thin films of SnO2:F deposited by spray pyrolysis over glass substrate at 300 °C are investigated using scanning, conventional and high resolution electron microscopy together with atomic force microscopy. The surface topology and morphology changes detected for films deposited with various fluorine levels are related to the electrical behavior.

AB - Thin films of SnO2:F deposited by spray pyrolysis over glass substrate at 300 °C are investigated using scanning, conventional and high resolution electron microscopy together with atomic force microscopy. The surface topology and morphology changes detected for films deposited with various fluorine levels are related to the electrical behavior.

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U2 - 10.1016/S0040-6090(00)01262-1

DO - 10.1016/S0040-6090(00)01262-1

M3 - Artículo

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VL - 375

SP - 147

EP - 150

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Structural and surface studies of tin oxide films doped with fluorine

Abstract

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