Abstract
Model consideration is given to explain observed multi-shell emission spectra from InAs quantum dots embedded in GaAs or InGaAs. The shell model is based on the quantization of kinetic energy of lateral motion of carrier in the dot. 2-D oscillator is calculated on the basis of effective mass approximation. Profiles of inter-level separation are classified into categories that are connected with the lateral confining potential. Comparison is carried with experimental data on InAs/InGaAs quantum dot structures of the DWELL type (dot-in-a-well).
Translated title of the contribution | Modelo de capa de puntos cuánticos de semiconductores |
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Original language | English |
Pages (from-to) | 46-53 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5349 |
DOIs | |
State | Published - 2004 |
Event | Physics and Simulation of Optoelectronic Devices XII - San Jose, CA, United States Duration: 26 Jan 2004 → 29 Jan 2004 |
Keywords
- Energy spectra
- Modeling
- Multi-shell emission
- Semiconductor quantum dots