Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers

J. A. Balderas-López; A. Mandelis

doi:10.1063/1.1623626

Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers

J. A. Balderas-López, A. Mandelis

Unidad Profesional Interdisciplinaria de Biotecnología (UPIBI)

Research output: Contribution to journal › Article › peer-review

56 Scopus citations

Abstract

The utilization of a self-normalized photothermal (PT) technique for the measurement of thermal diffusivity in thin metal layers was investigated. The PT study was based on photothermal radiometry and gas-cell photoacoustic detection techniques. The PT technique was employed on the two commercial samples of aluminum and steel thin layers. The study developed a criteria which ascertained the domination of a purely thermal-diffusion wave mechanism throughout the selected frequency range.

Original language	English
Pages (from-to)	5219-5225
Number of pages	7
Journal	Review of Scientific Instruments
Volume	74
Issue number	12
DOIs	https://doi.org/10.1063/1.1623626
State	Published - Dec 2003

Access to Document

10.1063/1.1623626

Cite this

@article{a5eee4ef9dfa4dc98c6674f0c024a4f5,

title = "Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers",

abstract = "The utilization of a self-normalized photothermal (PT) technique for the measurement of thermal diffusivity in thin metal layers was investigated. The PT study was based on photothermal radiometry and gas-cell photoacoustic detection techniques. The PT technique was employed on the two commercial samples of aluminum and steel thin layers. The study developed a criteria which ascertained the domination of a purely thermal-diffusion wave mechanism throughout the selected frequency range.",

author = "Balderas-L{\'o}pez, {J. A.} and A. Mandelis",

year = "2003",

month = dec,

doi = "10.1063/1.1623626",

language = "Ingl{\'e}s",

volume = "74",

pages = "5219--5225",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

number = "12",

}

TY - JOUR

T1 - Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers

AU - Balderas-López, J. A.

AU - Mandelis, A.

PY - 2003/12

Y1 - 2003/12

N2 - The utilization of a self-normalized photothermal (PT) technique for the measurement of thermal diffusivity in thin metal layers was investigated. The PT study was based on photothermal radiometry and gas-cell photoacoustic detection techniques. The PT technique was employed on the two commercial samples of aluminum and steel thin layers. The study developed a criteria which ascertained the domination of a purely thermal-diffusion wave mechanism throughout the selected frequency range.

AB - The utilization of a self-normalized photothermal (PT) technique for the measurement of thermal diffusivity in thin metal layers was investigated. The PT study was based on photothermal radiometry and gas-cell photoacoustic detection techniques. The PT technique was employed on the two commercial samples of aluminum and steel thin layers. The study developed a criteria which ascertained the domination of a purely thermal-diffusion wave mechanism throughout the selected frequency range.

UR - http://www.scopus.com/inward/record.url?scp=0347567164&partnerID=8YFLogxK

U2 - 10.1063/1.1623626

DO - 10.1063/1.1623626

M3 - Artículo

SN - 0034-6748

VL - 74

SP - 5219

EP - 5225

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 12

ER -

Self-normalized photothermal technique for accurate thermal diffusivity measurements in thin metal layers

Abstract

Access to Document

Other files and links

Fingerprint

Cite this