Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering

Juan B. Hurtado-Ramos; Orestes N. Stavroudis; Haiming Wang; Gilberto Gómez-Rosas

doi:10.1117/1.602395

Scattering loss measurements of evaporated slab waveguides of SiO₂ and NdF₃ using a prism coupler and angle-limited integrated scattering

Juan B. Hurtado-Ramos, Orestes N. Stavroudis, Haiming Wang, Gilberto Gómez-Rosas

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO₂ and NdF₃ waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle-limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.

Original language	English
Pages (from-to)	558-564
Number of pages	7
Journal	Optical Engineering
Volume	39
Issue number	2
DOIs	https://doi.org/10.1117/1.602395
State	Published - 2000
Externally published	Yes

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title = "Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering",

abstract = "A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO2 and NdF3 waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle-limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.",

author = "Hurtado-Ramos, {Juan B.} and Stavroudis, {Orestes N.} and Haiming Wang and Gilberto G{\'o}mez-Rosas",

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T1 - Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering

AU - Hurtado-Ramos, Juan B.

AU - Stavroudis, Orestes N.

AU - Wang, Haiming

AU - Gómez-Rosas, Gilberto

PY - 2000

Y1 - 2000

N2 - A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO2 and NdF3 waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle-limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.

AB - A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO2 and NdF3 waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle-limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.

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U2 - 10.1117/1.602395

DO - 10.1117/1.602395

M3 - Artículo

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VL - 39

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EP - 564

JO - Optical Engineering

JF - Optical Engineering

IS - 2

ER -

Scattering loss measurements of evaporated slab waveguides of SiO₂ and NdF₃ using a prism coupler and angle-limited integrated scattering

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