TY - JOUR
T1 - Retraction notice to Electrical and optical properties of nanostructured indium doped zinc oxide thin films deposited by ultrasonic chemical spray technique, starting from zinc acetylacetonate and indium chloride Materials Science in Semiconductor Processing, Volume 26, October 2014, Pages 288-293 (S1369800114002558) (10.1016/j.mssp.2014.05.011))
AU - Castañeda, L.
AU - Maldonado, A.
AU - Pérez, J. Vega
AU - Olvera, M. de la L.
AU - Torres-Torres, C.
N1 - Publisher Copyright:
© 2018
PY - 2018/6/1
Y1 - 2018/6/1
N2 - Available online < 22 May 2014 > This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor, after consultation with all the authors, due to an authorship dispute. Several of the co-authors (M. de la L. Olvera, J. Vega-Pérez and A. Maldonado) were not informed of their inclusion on the manuscript submitted to Materials Science in Semiconductor Processing. The editors do commend the last author for honest communication and prompt action to quickly resolve the matter.
AB - Available online < 22 May 2014 > This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor, after consultation with all the authors, due to an authorship dispute. Several of the co-authors (M. de la L. Olvera, J. Vega-Pérez and A. Maldonado) were not informed of their inclusion on the manuscript submitted to Materials Science in Semiconductor Processing. The editors do commend the last author for honest communication and prompt action to quickly resolve the matter.
UR - http://www.scopus.com/inward/record.url?scp=85043396398&partnerID=8YFLogxK
U2 - 10.1016/j.mssp.2018.03.005
DO - 10.1016/j.mssp.2018.03.005
M3 - Comentario/Debate
SN - 1369-8001
VL - 79
SP - 171
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
ER -