TY - GEN
T1 - Real-time turning surface inspection using laser light scattering
AU - Moreno-Báez, Arturo
AU - León, Gerardo Miramontes De
AU - Tenorio-Pérez, Francisco
AU - Ruiz-Torres, Maximiano
AU - Huerta-Ruelas, Jorge A.
PY - 2009/12/1
Y1 - 2009/12/1
N2 - An optical system for real-time measurements on a turning surface was designed and implemented in the optical metrology laboratory at CICATA-IPN. Different profiles of machined parts can be determined using a single detector or a photo-diode array. The basis of the measurement is the scattering of a laser beam which is reflected by the turning surface. Two different configurations were tested, the first one uses a single photodetector and a commercial lock-in amplifier, and the second uses a photodetector array and a proprietary platform. The samples under test were mounted on two different lathes for each configuration. The samples were rotating while the measurements were taken by the electronic system. Under these conditions it was possible to detect the intensity changes of the scattered light in the single detector case, and changes of the spread in the intensity distribution in the multidetector case. With the acquired data, qualitative profiles of the samples were obtained, with promising results. Potential applications in industry are straightforward when surface inspection is necessary to asses product's quality.
AB - An optical system for real-time measurements on a turning surface was designed and implemented in the optical metrology laboratory at CICATA-IPN. Different profiles of machined parts can be determined using a single detector or a photo-diode array. The basis of the measurement is the scattering of a laser beam which is reflected by the turning surface. Two different configurations were tested, the first one uses a single photodetector and a commercial lock-in amplifier, and the second uses a photodetector array and a proprietary platform. The samples under test were mounted on two different lathes for each configuration. The samples were rotating while the measurements were taken by the electronic system. Under these conditions it was possible to detect the intensity changes of the scattered light in the single detector case, and changes of the spread in the intensity distribution in the multidetector case. With the acquired data, qualitative profiles of the samples were obtained, with promising results. Potential applications in industry are straightforward when surface inspection is necessary to asses product's quality.
KW - Laser light scattering
KW - Lathe
KW - Photodetector array
UR - http://www.scopus.com/inward/record.url?scp=73849122483&partnerID=8YFLogxK
U2 - 10.1117/12.848671
DO - 10.1117/12.848671
M3 - Contribución a la conferencia
AN - SCOPUS:73849122483
SN - 9780819478108
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Seventh Symposium Optics in Industry
T2 - 7th Symposium Optics in Industry, VII SOI
Y2 - 11 September 2009 through 12 September 2009
ER -