Abstract
Paper presents the comparative investigation of photoluminescence and Raman scattering spectra of pure amorphous silicon films and amorphous silicon films with different size Si nanocrystallites. Several PL bands in the IR spectral range with maxima at 0.90, 0.98, 1.14 and 1.36 eV have been revealed in studied samples. The 0.90-0.98 eV PL bands are attributed to the band tail luminescence in Si nano crystallites with the size of 15-20 nm. Concurrently, the 1.18 and 1.36 eV PL bands are connected, apparently, with radiative transition between quantum confined levels within Si QDs (size of 5-6 nm) embedded into a-Si matrix.
Translated title of the contribution | Investigación óptica de nanocristales de Si en matriz de silicio amorfo |
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Original language | English |
Pages (from-to) | 510-513 |
Number of pages | 4 |
Journal | Microelectronics Journal |
Volume | 36 |
Issue number | 3-6 |
DOIs | |
State | Published - Mar 2005 |
Keywords
- Amorphous Si
- Band tail luminescence
- Si QD luminescence