Engineering & Materials Science
Atomic force microscopy
23%
Composite structures
75%
Defects
12%
Epilayers
62%
Impurities
17%
Ion beams
26%
Ion bombardment
29%
Ion implantation
100%
Ions
34%
Oxides
15%
Photoluminescence
29%
Photoluminescence spectroscopy
38%
Point defects
28%
Raman spectroscopy
24%
Surface morphology
20%
Temperature
7%
Wavelength
16%
X ray photoelectron spectroscopy
22%
Physics & Astronomy
atomic force microscopy
11%
bombardment
13%
characterization
41%
composite structures
84%
defects
8%
energy
4%
impurities
9%
ion beams
11%
ion implantation
67%
ion irradiation
15%
ions
13%
oxides
9%
photoelectron spectroscopy
12%
photoluminescence
20%
point defects
14%
Raman spectroscopy
12%
shoulders
16%
wavelengths
7%
x rays
6%
Chemistry
Atomic Force Microscopy
11%
Base Material
18%
Composite Material
36%
Crystal Point Defect
19%
Energy
6%
Ion
17%
Ion Beam
16%
Ion Implantation
90%
Modification
8%
Oxide
7%
Photoluminescence
11%
Photoluminescence Spectroscopy
16%
Raman Spectroscopy
11%
Surface
23%
X-Ray Photoelectron Spectroscopy
10%