TY - JOUR
T1 - Optical and structural studies of silicon-enriched films obtained by dc-magnetron co-sputtering
AU - Aguilar-Hernández, J. R.
AU - Monroy-Rodríguez, G.
AU - Cárdenas-García, M.
AU - Contreras-Puente, G. S.
N1 - Funding Information:
This work was partially supported by CGPI (SIP)-I.P.N.
PY - 2007/9
Y1 - 2007/9
N2 - We present in this work preliminary studies concerning the optical characterization, by optical absorption, photoluminescence and Raman spectroscopies, of Si-enriched films into a SiO2 matrix as a function of the Si concentration. The Si-molar concentration dependence shows different characteristics for each one of the samples: low Si concentration samples (lower than 50 mol% of silicon) showed, at room temperature, a low energy PL band around 1.6 eV, whereas samples with higher concentration (> 50 mol% of silicon) showed a PL band at 2.27 eV. Raman spectra of the samples account for different characteristics: low Si concentration samples showed a contribution of the amorphous phase of SiO2, whereas for high Si concentration samples, a relaxation of the selection rules is observed. Discussion and analysis of the experimental results are presented.
AB - We present in this work preliminary studies concerning the optical characterization, by optical absorption, photoluminescence and Raman spectroscopies, of Si-enriched films into a SiO2 matrix as a function of the Si concentration. The Si-molar concentration dependence shows different characteristics for each one of the samples: low Si concentration samples (lower than 50 mol% of silicon) showed, at room temperature, a low energy PL band around 1.6 eV, whereas samples with higher concentration (> 50 mol% of silicon) showed a PL band at 2.27 eV. Raman spectra of the samples account for different characteristics: low Si concentration samples showed a contribution of the amorphous phase of SiO2, whereas for high Si concentration samples, a relaxation of the selection rules is observed. Discussion and analysis of the experimental results are presented.
KW - Optical properties
KW - Photoluminescence
KW - SiO matrix
KW - Silicon nanoparticles
UR - http://www.scopus.com/inward/record.url?scp=34547668874&partnerID=8YFLogxK
U2 - 10.1016/j.msec.2006.06.018
DO - 10.1016/j.msec.2006.06.018
M3 - Artículo
SN - 0928-4931
VL - 27
SP - 1074
EP - 1077
JO - Materials Science and Engineering C
JF - Materials Science and Engineering C
IS - 5-8 SPEC. ISS.
ER -