TY - JOUR
T1 - Optical and structural evaluation of SiC nanocrystallites
AU - Diaz Cano, A. I.
AU - Torchynska, T.
AU - Rodriguez, M. Moralez
AU - Sandoval, S. Jiménez
AU - Minbaeva, M.
PY - 2007/4/1
Y1 - 2007/4/1
N2 - This paper presents results of the non-contact and non-destructive characterization of porous SiC layers using Raman scattering spectroscopy, scanning electron microscopy as well as atomic force microscopy methods. The comparative study of the Raman spectroscopy on the bulk SiC and porous SiC layers has shown a number of new features specific for nanocrystallite materials, which have been analyzed and discussed.
AB - This paper presents results of the non-contact and non-destructive characterization of porous SiC layers using Raman scattering spectroscopy, scanning electron microscopy as well as atomic force microscopy methods. The comparative study of the Raman spectroscopy on the bulk SiC and porous SiC layers has shown a number of new features specific for nanocrystallite materials, which have been analyzed and discussed.
UR - http://www.scopus.com/inward/record.url?scp=34247533403&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/61/1/049
DO - 10.1088/1742-6596/61/1/049
M3 - Artículo
AN - SCOPUS:34247533403
SN - 1742-6588
VL - 61
SP - 243
EP - 246
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 049
ER -