TY - JOUR
T1 - Optical and morphological characterization of (ZnO)x(CdO)1-x thin films
AU - Vaillant, L.
AU - Vigil, O.
AU - Contreras-Puente, G.
AU - Mejía-García, C.
N1 - Funding Information:
This work was partially supported by CONACyT-Mexico. One of us, LV, acknowledges the hospitality of ESFM-IPN. We thank Prof O. Zelaya-Angel for the SEM measurements.
PY - 2001/8/20
Y1 - 2001/8/20
N2 - The optical and morphological properties of (ZnO)x(CdO)1-x semiconductor thin films with x composition in the range 0 € × € 0.5 are studied by the photoluminescence optical technique (PL), and the Scanning Electron Microscopy (SEM). The evolution of the band associated with oxygen content in the films is observed and described as a function of the film composition and the thermal annealing. The surface morphology is presented, where two different binary semiconducting species can be discerned in proportions dependent on the films composition.
AB - The optical and morphological properties of (ZnO)x(CdO)1-x semiconductor thin films with x composition in the range 0 € × € 0.5 are studied by the photoluminescence optical technique (PL), and the Scanning Electron Microscopy (SEM). The evolution of the band associated with oxygen content in the films is observed and described as a function of the film composition and the thermal annealing. The surface morphology is presented, where two different binary semiconducting species can be discerned in proportions dependent on the films composition.
UR - http://www.scopus.com/inward/record.url?scp=0035921502&partnerID=8YFLogxK
U2 - 10.1142/S0217984901002245
DO - 10.1142/S0217984901002245
M3 - Artículo
AN - SCOPUS:0035921502
SN - 0217-9849
VL - 15
SP - 663
EP - 666
JO - Modern Physics Letters B
JF - Modern Physics Letters B
IS - 17-19
ER -