Luminescence and structure of ZnO-ZnS thin films prepared by oxidation of ZnS films in air and water vapor

T. Kryshtab, V. S. Khomchenko, J. A. Andraca-Adame, A. K. Savin, A. Kryvko, G. Juárez, R. Peña-Sierra

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

Effect of water vapor quantity at oxidation of undoped ZnS films on structural and luminescent properties of the obtained films was investigated. The films were deposited onto glass substrates by electron beam evaporation. ZnO-ZnS layers were prepared by thermal oxidization of ZnS films at 600 °C in dry or wet atmospheres. The films were characterized by X-ray diffraction, atomic force microscopy and photoluminescence spectroscopy. As-deposited ZnS films were sphalerite crystal structure. The "dry annealing" led to the ZnS phase transition from sphalerite to wurtzite structure and from ZnS to ZnO for a small fraction of the film. After the "wet annealing" the amount of ZnO phase with wurtzite structure growing along the 〈0 0 0 2〉 direction varied from 25% to 95% in dependence on the water vapor quantity. Photoluminescent spectrum at room temperature exhibits green emission with maximum at 2.4 eV. A strong influence of the water vapor on shape and intensity of the emission was observed. Photoluminescent spectra at 22 K consisted of two bands-high-energy band at 2.1-2.4 eV and low energy band at 1.7-1.8 eV. Location and intensity ratio depended on the preparation conditions.

Original languageEnglish
Pages (from-to)1677-1681
Number of pages5
JournalJournal of Luminescence
Volume129
Issue number12
DOIs
StatePublished - Dec 2009

Keywords

  • Photoluminescence
  • Thermal oxidation
  • X-ray diffraction
  • ZnO
  • ZnS

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