Large grain size CdTe films grown on glass substrates at low temperature

M. Zapata-Torres, R. Castro-Rodriquez, A. Zapata-Navarro, John L. Wallace, Ramon Pomes, J. L. Pena

Research output: Contribution to journalComment/debate

1 Scopus citations

Abstract

Polycrystalline films of CdTe were prepared by the hot wall-close-spaced vapor transport technique on Corning glass substrates at substrate temperatures below 450 °C. The thickness of the films was constant at 25 μm for all samples grown at different substrate temperatures and different gas pressures. The film thickness was found to be a function of deposition time only (5μm per min), and virtually independent of substrate temperature and control gas pressure. The grain size was a monotonic function of film thickness, reaching 40 μm for a film thickness of 50 μm.

Original languageEnglish
Pages (from-to)2994-2996
Number of pages3
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume13
Issue number6
DOIs
StatePublished - Nov 1995
Externally publishedYes

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