Intensity normalization of additive and multiplicative spatially multiplexed patterns with n encoded phases

Rigoberto Juarez-Salazar, Carlos Robledo-Sanchez, Fermin Guerrero-Sanchez, Antonio Barcelata-Pinzon, Jorge Gonzalez-Garcia, Agustin Santiago-Alvarado

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

An efficient, robust and user-free intensity normalization method for patterns with n frequency-multiplexed phases of both additive and multiplicative types is proposed. For this, the parameter estimation approach by using the least-squares method is applied. The theoretical principles are given and the good performance of the proposal is verified by computer simulation and experimental results. Because the proposed method has good features such as robustness, simplicity, fast and user-free execution, it could be implemented in a wide variety of applications. This contribution motivates future generalization in both phase demodulation algorithms and experimental setups to exploit the benefits of additive/multiplicative patterns with multiple phases.

Original languageEnglish
Pages (from-to)225-229
Number of pages5
JournalOptics and Lasers in Engineering
Volume77
DOIs
StatePublished - 1 Feb 2016
Externally publishedYes

Keywords

  • Digital image processing
  • Fringe analysis
  • Image enhancement
  • Intensity normalization
  • Phase measurement

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