Ground and excited state photoluminescence mapping on InAs/InGaAs quantum dot structures

T. V. Torchynska, E. Velázquez Lozada, M. Dybiec, S. Ostapenko, P. G. Eliseev, A. Stintz, K. J. Malloy, R. Pena Sierra

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents the photoluminescence study at 12 K and scanning photoluminescence spectroscopy investigation of the ground and excited states at 80 and 300 K on InAs QDs inserted in In0.15 Ga0.85 As/Ga As QW structures and created at different QD growth temperatures. It is shown that investigated structures are characterized by the long range variation of an average QD size in QD ensemble across the wafer. This long range QD size inhomogeneity was used for investigation of the multi-excited state energy trend versus ground state energy (or QD sizes).

Original languageEnglish
Pages (from-to)383-387
Number of pages5
JournalInternational Journal of Nanoscience
Volume6
Issue number5
DOIs
StatePublished - Oct 2007

Keywords

  • InAs quantum dots
  • Multi-excited states
  • Photoluminescence

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