TY - JOUR
T1 - Fully patterned and low temperature transparent ZnO-based inverters
AU - Gutierrez-Heredia, G.
AU - Mejia, I.
AU - Rivas-Aguilar, M. E.
AU - Hernandez-Como, N.
AU - Martinez-Landeros, V. H.
AU - Aguirre-Tostado, F. S.
AU - Quevedo-Lopez, M. A.
N1 - Funding Information:
This work was partially supported by CONACYT Mexico.
PY - 2013/10/31
Y1 - 2013/10/31
N2 - The fabrication and characterization of transparent logic inverters based on zinc oxide (ZnO) thin film transistors (TFTs) is reported.The inverters are fabricated using standard photolithographic techniques on glass substrates, and the entire fabrication process temperature is maintained < 100 C, which render the devices suitable for flexible and transparent electronics applications.Pulsed laser deposition is used to deposit aluminum-doped zinc oxide and ZnO as electrode and active semiconductor materials, respectively.Electrical characterization for individual TFTs demonstrate mobilities of ∼ 10 cm2/V-s, threshold voltages of 6 V, sub-threshold slopes of 630 mV/decade and ION/IOFF ratios of 5 × 106.Films characterized by UV-Vis showed optical transmission > 80% in the visible spectrum.The inverters are analyzed with AC input signals at frequencies of 100 and 500 Hz.The AC response shows an average rise and fall time transitions of 0.65 and 0.44 ms, respectively.Measured inverters delay is in the order of 0.21 ms.
AB - The fabrication and characterization of transparent logic inverters based on zinc oxide (ZnO) thin film transistors (TFTs) is reported.The inverters are fabricated using standard photolithographic techniques on glass substrates, and the entire fabrication process temperature is maintained < 100 C, which render the devices suitable for flexible and transparent electronics applications.Pulsed laser deposition is used to deposit aluminum-doped zinc oxide and ZnO as electrode and active semiconductor materials, respectively.Electrical characterization for individual TFTs demonstrate mobilities of ∼ 10 cm2/V-s, threshold voltages of 6 V, sub-threshold slopes of 630 mV/decade and ION/IOFF ratios of 5 × 106.Films characterized by UV-Vis showed optical transmission > 80% in the visible spectrum.The inverters are analyzed with AC input signals at frequencies of 100 and 500 Hz.The AC response shows an average rise and fall time transitions of 0.65 and 0.44 ms, respectively.Measured inverters delay is in the order of 0.21 ms.
KW - Aluminum-doped zinc oxide
KW - Pulsed laser deposition
KW - Thin film transistors
KW - Transparent electronics
KW - Zinc oxide
UR - http://www.scopus.com/inward/record.url?scp=84884980694&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2013.07.069
DO - 10.1016/j.tsf.2013.07.069
M3 - Artículo
SN - 0040-6090
VL - 545
SP - 458
EP - 461
JO - Thin Solid Films
JF - Thin Solid Films
ER -