FPGA-based test bed for measurement of AM/AM and AM/PM distortion and modeling memory effects in RF PAs

José Cruz Núñez-Pérez, José Ricardo Cárdenas-Valdez, Katherine Montoya-Villegas, J. Apolinar Reynoso-Hernández, José Raúl Loo-Yau, Christian Gontrand, Esteban Tlelo-Cuautle

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Using a field-programmable gate array (FPGA) development board, a digital signal processor (DSP) builder, and the phase-to-amplitude conversion principle, a low-cost system for measuring the amplitude-to-amplitude (AM/AM) and amplitude-to-phase (AM/PM) distortion curves of radio frequency (RF) power amplifiers (PAs) is presented. The state of the art based on the measurements and preliminary studies of AM/AM and AM/PM distortion curves is discussed. A full digital control of the test bed simulated/emulated in Matlab/Simulink is introduced to recalculate the known AM/AM and AM/PM measurements stored as look-up table (LUT). Finally, the low-cost system comprises the memory polynomial model (MPM) that involves the nonlinearity order and memory effects of real PAs.

Original languageEnglish
Pages (from-to)291-300
Number of pages10
JournalIntegration, the VLSI Journal
Volume52
DOIs
StatePublished - 1 Jan 2016
Externally publishedYes

Keywords

  • AM/AM
  • AM/PM
  • Field-programmable gate arrays
  • Memory modeling
  • Memory polynomial model
  • Power amplifier
  • RF
  • Test bed

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