Abstract
Photoluminescence (PL), PL excitation and atomic force microscopy investigations of porous silicon (PSi) have been done in as-prepared state and after 1.0 year storage in ambient air. In as-prepared state, PSi layers are characterised by two PL bands peaked at 1.70 and 2.00 eV. The complex analysing of the changes of PL parameters during the formation of the Si/SiOx interface give possibility to make conclusion concerning the PL and PL excitation mechanisms for both PL bands in Si-nano-crystallites.
Original language | English |
---|---|
Pages (from-to) | 759-761 |
Number of pages | 3 |
Journal | Microelectronics Journal |
Volume | 34 |
Issue number | 5-8 |
DOIs | |
State | Published - May 2003 |
Keywords
- Nano-structures
- Photoluminescence
- Porous silicon