TY - GEN
T1 - Fault detection for SiC-Mosfet based on the behavior of gate signal
AU - Climaco-Arvizu, O.
AU - Hernández-González, L.
AU - Rodríguez-Blanco, M. A.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/10/21
Y1 - 2015/10/21
N2 - We present the design and simulation of a fault detection circuit applied to a Silicon Carbide Mosfet (SiC-Mosfet), fault detection is done by examining the behavior of gate signal. The most important aspects that have been made and are reported specifically: early detection, since the evaluation is done during the transient of turn-on, allowing early detection in the case of short-circuit, failure detection times small as which prevents to the spread to full system. To validate the system, this was designed and applied to failure detection to Boost-Converter with SiC-Mosfet, the simulation results to validate the robustness and reliability of the electronic system designed.
AB - We present the design and simulation of a fault detection circuit applied to a Silicon Carbide Mosfet (SiC-Mosfet), fault detection is done by examining the behavior of gate signal. The most important aspects that have been made and are reported specifically: early detection, since the evaluation is done during the transient of turn-on, allowing early detection in the case of short-circuit, failure detection times small as which prevents to the spread to full system. To validate the system, this was designed and applied to failure detection to Boost-Converter with SiC-Mosfet, the simulation results to validate the robustness and reliability of the electronic system designed.
KW - Analog circuits
KW - DC-DC power converters
KW - Electrical fault detection
KW - Power MOSFET
KW - SPICE
KW - Silicon Carbide
KW - Wide band gap semiconductors
UR - http://www.scopus.com/inward/record.url?scp=84959269930&partnerID=8YFLogxK
U2 - 10.1109/DEMPED.2015.7303671
DO - 10.1109/DEMPED.2015.7303671
M3 - Contribución a la conferencia
AN - SCOPUS:84959269930
T3 - Proceedings - SDEMPED 2015: IEEE 10th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives
SP - 71
EP - 76
BT - Proceedings - SDEMPED 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2015
Y2 - 1 September 2015 through 4 September 2015
ER -