TY - JOUR
T1 - Fault Detection Circuit Based on IGBT Gate Signal
AU - Flores, Eligio
AU - Claudio, Abraham
AU - Aguayo, Jesus
AU - Hernandez, Leobardo
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/2
Y1 - 2016/2
N2 - The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.
AB - The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.
KW - Early Fault detection
KW - IGBT devices
KW - Short circuit and Open circuit Faults
KW - fault detection signals
UR - http://www.scopus.com/inward/record.url?scp=84964397489&partnerID=8YFLogxK
U2 - 10.1109/TLA.2016.7437190
DO - 10.1109/TLA.2016.7437190
M3 - Artículo
SN - 1548-0992
VL - 14
SP - 541
EP - 548
JO - IEEE Latin America Transactions
JF - IEEE Latin America Transactions
IS - 2
M1 - 7437190
ER -