Experimental and modelling investigation of the influence of noise transit time and self-heating on microwave noise of Si/SiGe:C and InP/InGaAs HBTs

E. Ramirez-Garcia, F. P. Aniel, M. A. Enciso-Aguilar, M. Riet, N. Zerounian

Research output: Contribution to journal › Article › peer-review

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