Abstract
The photoluminescence (PL), its temperature and power dependences have been studied in InAs quantum dots (QDs) embedded in asymmetric InxGa1-y As/GaAs quantum wells (QWs) with variable InxGa1-x As compositions in the capping layer. Three stages for thermally activated decay of QD PL intensity have been revealed. A set of rate equations for exciton dynamics (relaxation into QWs and QDs, and thermal escape) are solved to analyze the mechanism of PL thermal decay. The variety of PL intensities and peak positions, as well as the activation energies of PL intensity decay in DWELL structures with different compositions of a capping layer are discussed.
Original language | English |
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Pages (from-to) | 349-355 |
Number of pages | 7 |
Journal | Superlattices and Microstructures |
Volume | 45 |
Issue number | 4-5 |
DOIs | |
State | Published - Apr 2009 |
Keywords
- Exciton thermal escape
- Photoluminescence
- Quantum dots