TY - JOUR
T1 - Emission and structure varieties in ZnO:Ag nanorods obtained by ultrasonic spray pyrolysis
AU - Lozada, E. Velázquez
AU - Torchynska, T. V.
AU - Espinola, J. L.Casas
PY - 2014
Y1 - 2014
N2 - Scanning electronic microscopy (SEM), X ray diffraction (XRD) and photoluminescence (PL) have been applied to the study of the structural and optical properties of ZnO nanocrystals prepared by the ultrasonic spray pyrolysis (USP) at different temperatures. The variation of temperatures and times at the growth of ZnO films permits modifying the ZnO phase from the amorphous to crystalline, to change the size of ZnO nanocrystals (NCs), as well as to vary their photoluminescence spectra. The study has revealed three types of PL bands in ZnO NCs: defect related emission, the near-band-edge (NBE) PL, related to the LO phonon replica of free exciton (FE) recombination, and FE second-order diffraction peaks. The PL bands related to the LO phonon replica of FE in PL spectra measured at room temperature testify on the high quality of ZnO films prepared by the USP technology.
AB - Scanning electronic microscopy (SEM), X ray diffraction (XRD) and photoluminescence (PL) have been applied to the study of the structural and optical properties of ZnO nanocrystals prepared by the ultrasonic spray pyrolysis (USP) at different temperatures. The variation of temperatures and times at the growth of ZnO films permits modifying the ZnO phase from the amorphous to crystalline, to change the size of ZnO nanocrystals (NCs), as well as to vary their photoluminescence spectra. The study has revealed three types of PL bands in ZnO NCs: defect related emission, the near-band-edge (NBE) PL, related to the LO phonon replica of free exciton (FE) recombination, and FE second-order diffraction peaks. The PL bands related to the LO phonon replica of FE in PL spectra measured at room temperature testify on the high quality of ZnO films prepared by the USP technology.
UR - http://www.scopus.com/inward/record.url?scp=84903592006&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/494/1/012011
DO - 10.1088/1742-6596/494/1/012011
M3 - Artículo de la conferencia
AN - SCOPUS:84903592006
SN - 1742-6588
VL - 494
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012011
T2 - International Conference on Microtechnology and Thermal Problems in Electronics, MicroTherm' 2013
Y2 - 25 June 2013 through 28 June 2013
ER -