TY - JOUR
T1 - Elastic stress and emission nonhomogeneity in asymmetric InAs quantum dot in a well structures
AU - Casas Espínola, José L.
AU - Torchynska, Tetyana V.
AU - Palacios Gomez, Jesús
AU - Gómez Gasga, G.
AU - Vivas Hernández, Alejandro
AU - Cisneros Tamayo, Ricardo
PY - 2011/4
Y1 - 2011/4
N2 - Photoluminescence (PL) and X-ray diffraction (XRD) have been studied in InAs quantum dots (QDs) embedded in asymmetric GaAs/InxGa1-xAs/In0.15Ga1-0.15As/GaAs quantum wells (dot-in-a-well, DWELL) with the parameter x=0.10-0.25. The parameter x increasing in the capping layer is accompanied by the non monotonous variation of InAs QD parameters. The PL intensity increases and the PL peak shifts to low energy in structures with x=0.15. On the contrary the structures with x=0.20 and 0.25 are characterized by lower PL intensities and PL peak positions shifted to higher energy. The method of X-ray diffraction has been applied with the aim to study the variation of elastic strain in asymmetric DWELL structures. It was shown that the minimum of elastic strain corresponds to DWELL with x=0.15. In DWELLs with x=0.20 and 0.25 the level of compressive strain increases. The reasons of strain variation are discussed as well.
AB - Photoluminescence (PL) and X-ray diffraction (XRD) have been studied in InAs quantum dots (QDs) embedded in asymmetric GaAs/InxGa1-xAs/In0.15Ga1-0.15As/GaAs quantum wells (dot-in-a-well, DWELL) with the parameter x=0.10-0.25. The parameter x increasing in the capping layer is accompanied by the non monotonous variation of InAs QD parameters. The PL intensity increases and the PL peak shifts to low energy in structures with x=0.15. On the contrary the structures with x=0.20 and 0.25 are characterized by lower PL intensities and PL peak positions shifted to higher energy. The method of X-ray diffraction has been applied with the aim to study the variation of elastic strain in asymmetric DWELL structures. It was shown that the minimum of elastic strain corresponds to DWELL with x=0.15. In DWELLs with x=0.20 and 0.25 the level of compressive strain increases. The reasons of strain variation are discussed as well.
KW - Dot-in-a-well
KW - InAs
KW - Photoluminescence
KW - Quantum dots
KW - X-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=79953734846&partnerID=8YFLogxK
U2 - 10.1002/pssc.201083999
DO - 10.1002/pssc.201083999
M3 - Artículo
SN - 1862-6351
VL - 8
SP - 1391
EP - 1393
JO - Physica Status Solidi (C) Current Topics in Solid State Physics
JF - Physica Status Solidi (C) Current Topics in Solid State Physics
IS - 4
ER -