Effects of Surface in the IR and Raman Spectrum of Porous Silicon Carbide

R. Bermeo, L. Arellano, A. Trejo, F. Salazar, M. Calvino, A. Miranda, M. Cruz-Irisson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Original language	Undefined/Unknown
Title of host publication	IOP Conference Series: Materials Science and Engineering
DOIs	https://doi.org/10.1088/1757-899X/840/1/012009
State	Published - 2020

Access to Document

@inproceedings{5667078b265c44bf89882ebef9828348,

title = "Effects of Surface in the IR and Raman Spectrum of Porous Silicon Carbide",

author = "R. Bermeo and L. Arellano and A. Trejo and F. Salazar and M. Calvino and A. Miranda and M. Cruz-Irisson",

year = "2020",

doi = "10.1088/1757-899X/840/1/012009",

language = "Indefinido/desconocido",

booktitle = "IOP Conference Series: Materials Science and Engineering",

}

TY - GEN

T1 - Effects of Surface in the IR and Raman Spectrum of Porous Silicon Carbide

AU - Bermeo, R.

AU - Arellano, L.

AU - Trejo, A.

AU - Salazar, F.

AU - Calvino, M.

AU - Miranda, A.

AU - Cruz-Irisson, M.

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85086384349&partnerID=MN8TOARS

U2 - 10.1088/1757-899X/840/1/012009

DO - 10.1088/1757-899X/840/1/012009

M3 - Contribución a la conferencia

BT - IOP Conference Series: Materials Science and Engineering

ER -